Scripta Mater. 36, 943-947, 1997


ON STRESS SINGULARITIES AT FREE EDGES
OF BIMATERIAL JUNCTIONS -
A MICROMECHANICAL STUDY

C.M. Chimani, H.J. Böhm and F.G. Rammerstorfer

Institute of Lightweight Structures and Aerospace Engineering,
TU Wien, Vienna, Austria


Abstract - When homogeneous material descriptions are used in studying the elastic stress field at the free edge of a bimaterial junction, typically a weak and highly localized singularity is predicted. By using a micromechanical model corresponding corresponding to a selectively reinforced sample it is demonstrated that no singularity is present in some cases where one of the materials contains inhomogeneities of a size comparable to or larger than the local region affected by the singularity.


(hjb,970402)